DEG_ID structure handles the identifications of which degradation model(s) to use.
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#include <DEG_ID.hpp>
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using | data_t = uint_fast8_t |
| Alias for uint_fast8_t as data_t. More...
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DegArray | SEI_id {} |
| Array with identifications to decide which SEI models to use. More...
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data_t | SEI_porosity { 0 } |
| Integer deciding whether we reduce the active volume fraction due to SEI growth. More...
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DegArray | CS_id |
| Array with identifications for which model to use for surface cracking. Max length 10. More...
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data_t | CS_diffusion { 0 } |
| Integer deciding whether we reduce the negative diffusion constant due to surface cracks. More...
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DegArray | LAM_id |
| Array with the integers deciding which models is to be used for loss of active material. Max length 10. More...
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data_t | pl_id { 0 } |
| Integer deciding which model is to be used for li-plating. More...
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static constexpr data_t | len = 10 |
| Length of the arrays with identifications of which models to use. More...
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DEG_ID structure handles the identifications of which degradation model(s) to use.
◆ data_t
Alias for uint_fast8_t as data_t.
◆ print()
auto slide::DEG_ID::print |
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inline |
- 0: no plating
- 1: Yang et al thermodynamic plating (Tafel kinetics)
Function to get a string representation of the struct with the degradation settings. This string is part of the names of the subfolders in which results are written.
- Returns
- std::string representation of the degradation identifiers. Identifiers of the same mechanism are separated by -. Identifiers of different mechanisms are separated by _. e.g., if we use SEI model 1, no SEI porosity effect, no surface cracks, LAM model 2 and LAM model 3 and lithium plating model 1: 2-0_0-0_2-3_1 2: SEI model 1 0: no SEI porosity 0: no surface cracks 0: don't decrease the diffusion due to surface cracks 2: LAM model 2 3: LAM model 3 1: lithium plating model 1
◆ CS_diffusion
data_t slide::DEG_ID::CS_diffusion { 0 } |
Integer deciding whether we reduce the negative diffusion constant due to surface cracks.
- 0: no surface cracking
- 1: Laresgoiti's stress + crack growth model, ref: Laresgoiti, Kablitz, Ecker, Sauer, Journal of Power Sources 300, 2015
- 2: Dai stress model + Laresgoiti crack growth, ref: Laresgoiti, Kablitz, Ecker, Sauer, Journal of Power Sources 300, 2015; Dai, Cai, White, Journal of Power sources 247, 2014
- 3: model based on Deshpande and Bernardi, ref: Deshpande & Bernardi, Journal of the Electrochemical Society 164 (2), 2017
- 4: model from Barai et al, ref: Barai, Smith, Chen, Kim, Mukherjee, Journal of the Electrochemical Society 162 (9), 2015
- 5: model from Ekstrom et al, ref: Ekstrom and Lindbergh, Journal of the Electrochemical Society 162 (6), 2015
◆ CS_id
Array with identifications for which model to use for surface cracking. Max length 10.
- 0: don't reduce it
- 1: use correlation from Ashwin et al. 2016, ref: Ashwin, Chung, Wang, Journal of Power Sources 328, 2016
◆ LAM_id
Array with the integers deciding which models is to be used for loss of active material. Max length 10.
- 0: don't decrease diffusion
- 1: decrease according to Barai et al. 2015
◆ len
constexpr data_t slide::DEG_ID::len = 10 |
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staticconstexpr |
Length of the arrays with identifications of which models to use.
◆ pl_id
data_t slide::DEG_ID::pl_id { 0 } |
Integer deciding which model is to be used for li-plating.
- 0: no LAM
- 1: Dai's stress model and Laresgoiti's correlation to get LAM
- 2: delacourt's correlation between abs(j) and porosity
- 3: Kindermann's model for cathode dissolution: tafel kinetics for increased porosity
- 4: Narayanrao's correlation which decreases the effective surface area proportionally to itself and j
◆ SEI_id
Array with identifications to decide which SEI models to use.
◆ SEI_porosity
data_t slide::DEG_ID::SEI_porosity { 0 } |
Integer deciding whether we reduce the active volume fraction due to SEI growth.
- 0: no SEI growth
- 1: kinetic model only (Tafel kinetics), ref: Ning & Popov, Journal of the Electrochemical Society 151 (10), 2004
- 2: Pinson&Bazant model: linear diffusion + Tafel kinetics, ref: Pinson & Bazant, Journal of the Electrochemical society 160 (2), 2013
- 3: Christensen and Newman model, ref: Christensen & Newmann, Journal of the Electrochemical Society 152 (4), 2005
The documentation for this struct was generated from the following file: